One trend that I am currently seeing is production monitoring, which can be carried out, e.g., by an on-line characterisation system. However, this usually lends itself only to the production process and not to the final inspection. New on-line characterisation methods in the submicron and nanometre range are in particularly great demand. In this context, we and several partners have developed an in-line measurement system based on dynamic light scattering. Additionally analytical methods and metrology in the production of nanostructured systems are becoming increasingly important. This was the reason behind the setting up of the "Nanoanalytics and Metrology in Production" ...